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News

Publications

  1. T. Ratier, L. Van Brandt, N. Bidoul, J.-C. Delvenne, and D. Flandre, “Stochasticity-aware modeling methodology of mott memristors validated on vanadium dioxide devices,” in Engineering Research Express, 2026. DOI: 10.1088/2631-8695/ae36ef
  2. P. Biswas, M. Dörpinghaus, and G. P. Fettweis, “Integrate and Fire Counting Spike Detection for Spiking Communications,” in 2026 IEEE Wireless Communications and Networking Conference (WCNC), 2026.
  3. P. Biswas, M. Dörpinghaus, and G. P. Fettweis, “IF-TEM-Based Detection for Spike Communications With RLL Encoding,” in IEEE Communications Letters, vol. 30, 2026. DOI: 10.1109/LCOMM.2025.3644693
  4. N. I. Bernardo, S. B. Shah, and Y. C. Eldar, “Modulo Sampling: Performance Guarantees in the Presence of Quantization,” in IEEE Transactions on Signal Processing, vol. 73, 2025. DOI: 10.1109/TSP.2025.3598420
  5. H. Naaman, N. I. Bernardo, A. Cohen, and Y. C. Eldar, “Time Encoding Quantization of Bandlimited and Finite-Rate-of-Innovation Signals,” in IEEE Access, vol. 13, 2025. DOI: 10.1109/ACCESS.2025.3626162
  6. T. Ratier and D. Flandre, “Infrared Optical Modulation Using a Vanadium Dioxide-based Meta-surface,” in Congrès général de la société de physique française de physique, 2025.
  7. A. Varini, C. Masserey, V. Conti, Z. Saadat Somaehsofla, E. Ansari, I. Stolichnov, and A. M. Ionescu, “Pulsed Laser and Atomic Layer Deposition of CMOS-Compatible Vanadium Dioxide: Enabling Ultrathin Phase-Change Films,” in ACS Applied Electronic Materials, vol. 7, no. 14, pp. 6707-6719, 2025. DOI: 10.1021/acsaelm.5c01132
  8. G. Brandsteert, L. V. Brandt, and D. Flandre, “Reliability Analyses of Ultra-Low Voltage Analog Spiking Neurons,” in 32nd International Conference on Mixed Design of Integrated Circuits and Systems (MIXDES), Szczecin, Poland, 2025, pp. 156-160. DOI: 10.23919/MIXDES66264.2025.11092240
  9. H. Greatorex, O. Richter, M. Mastella, et al., “A neuromorphic processor with on-chip learning for beyond-CMOS device integration,” in Nature Communications, vol. 16, p. 6424, 2025. DOI: 10.1038/s41467-025-61576-6
  10. T. Ratier, L. Van Brandt, G. Brandsteert, J.-C. Delvenne, and D. Flandre, “VO2 Based Memristor for Neuromorphic,” in COMPLEX Doctoral School, 2025.
  11. X. Zeng, N. André, E. Masarweh, O. Bonfanti, and D. Flandre, “Electromechanical Measurements and Modeling of a High-Performance Small-Area Ultra-Thin SOI MEMS Piezoresistive Pressure Sensor,” in IEEE Transactions on Instrumentation and Measurement, vol. 74, pp. 1-9, 2025, Art no. 7507509. DOI: 10.1109/TIM.2025.3566836
  12. D. Flandre, N. Bidoul, G. Brandsteert, J. C. Delvenne, T. Ratier, X. Zeng, and L. Van Brandt, “Emerging Vanadium Dioxide Memristor-Based Spiking Concepts Towards Analog Neuromorphic Event Sensing,” in X Ukrainian Scientific Conference on Semiconductor Physics, 2025, p. 15.
  13. A. M. Ionescu, “Future of Computing: Towards Energy Efficient Cognitive Chips,” in 2025 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA), Hsinchu, Taiwan, 2025, pp. 01-02. DOI: 10.1109/VLSITSA64674.2025.11047135
  14. T. Ratier, J.-C. Delvenne, D. Flandre, and L. Van Brandt, “Compact Modelling of Memristors Toward Analog Neuromorphic Circuit Simulations,” in Modeling of Systems and Parameter Extraction Working Group 17th International MOS-AK Workshop, Silicon Valley, USA, Dec 2024. DOI: 10.5281/zenodo.14623688
  15. T. Ratier, C. Gevers, and D. Flandre, “Phase Change Material for IR Sensing: Plasmonic Photothermal Conversion,” in Excerpt from the Proceedings of the COMSOL Conference 2024, Florence, Italy, 2024. URL: Phase-Change Material for IR Sensing
  16. T. Ratier, C. Gevers, and D. Flandre, “IR Sensing Based on VO2 Resistor Enhanced by Plasmonic Engineering,” in Proceedings of the 5th bePOM Conference, 2024.
  17. F. Roth, M. Dörpinghaus, S. Zeitz, F. Gast, and G. Fettweis, “Why to Use the Phase in Time-Encoding Modulation and Its Effect on the Spectral Efficiency,” in Proceedings of IEEE International Symposium on Personal, Indoor and Mobile Radio Communications (PIMRC 2024), Valencia, Spain, Sep 2024. DOI: 10.1109/PIMRC59610.2024.10817435
  18. N. Bidoul et al., “Process-Based Life Cycle Assessment of a Vanadium Dioxide Spiking Neuron,” in Electronics Goes Green 2024+ (EGG), Berlin, Germany, 2024, pp. 1-7. DOI: 10.23919/EGG62010.2024.10631188